An Atomic Force Microscope (AFM) provides 3 dimensional topographic information about a sample by probing its surface structure with a very sharp tip. The tip is scanned laterally across the surface, and the vertical movements of the tip are recorded and used to construct a quantitative 3 dimensional topographic map. The lateral resolution of the image can be as small as the tip radius (typically 5-15 nm), and the vertical resolution can be on the order of angstroms.

Technique Advantages

  • Quantitative topographical information at high lateral resolution
  • Little or no sample prep in many cases
  • Non-destructive
  • Applicable to conductive and insulating materials

AFM afm_

The system is modular and multifunctional. The basic version comes with a SPM that provides scanning ranges of up to 40µm and is upgradable with numerous SPM modes. In addition, the optical microscope is equipped with bright- and darkfield observation, and is also extendable with the most common optical methods and supplementary instrumentation, e.g. CCD-camera, etc.

SPM system: ULTRAObjective

51 µm x 51 µm,

100 µm x 100 µm

Resolution: about 7 nm
Microscope Zeiss Axiotech H/HD/HD-DIC
on granite stand
Stages motorized vertical stage numerous types available: manual, motorized...
Dimensions of sample height: 0.1-4 mm, width: 50 mm, length: 50 mm.
Workbench rigid workbench including high performance antivibration table top MOD-1
Applications: custom-made surface inspection system