Atomic Force Microscope S.I.S-ULTRAObjective NANOStation II
An Atomic Force Microscope (AFM) provides 3 dimensional topographic information about a sample by probing its surface structure with a very sharp tip. The tip is scanned laterally across the surface, and the vertical movements of the tip are recorded and used to construct a quantitative 3 dimensional topographic map. The lateral resolution of the image can be as small as the tip radius (typically 5-15 nm), and the vertical resolution can be on the order of angstroms. 

Technique Advantages:

    Quantitative topographical information at high lateral resolution;

    Little or no sample prep in many cases;


    Applicable to conductive and insulating materials.

    SPM system:  ULTRAObjective 

    Range: 51 µm x 51 µm, 
            100 µm x 100 µm 

    Resolution: about 7 nm 

    Microscope: Zeiss Axiotech H/HD/HD-DIC on granite stand 

    Stages: motorized vertical stage numerous types available: manual, motorized... 

    Dimensions of sample: height: 0.1-4 mm, width: 50 mm, length: 50 mm. 

    Workbench: rigid workbench including high performance antivibration table top MOD-1